Canlyniadau Chwilio - Poggi, Antonella

Intrinsic gettering of Cr impurities in p-type Cz silicon gan Adegboyega, G.A, Poggi, Antonella

Cael y testun llawn

Deep level transient spectroscopy study of the damage induced in n-type silicon by a gate oxide etching in a CHF3/Ar plasma gan Adegboyega, G., Perez, I.V, Poggi, Antonella, Susi, E

Cael y testun llawn

Electrical Properties of Silver Impurities and their Annealing Behaviour in p-Type Fz Silicon gan Adegboyega, G.A, Passari, L, Butturri, Maria Angela, Poggi, Antonella

Cael y testun llawn