Ohcanbohtosat - Poggi, Antonella

Intrinsic gettering of Cr impurities in p-type Cz silicon Dahkki Adegboyega, G.A, Poggi, Antonella

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Deep level transient spectroscopy study of the damage induced in n-type silicon by a gate oxide etching in a CHF3/Ar plasma Dahkki Adegboyega, G., Perez, I.V, Poggi, Antonella, Susi, E

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Electrical Properties of Silver Impurities and their Annealing Behaviour in p-Type Fz Silicon Dahkki Adegboyega, G.A, Passari, L, Butturri, Maria Angela, Poggi, Antonella

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