Resultados de búsqueda - Susi, E

  • Mostrando 1 - 2 Resultados de 2
Limitar resultados
  1. 1
    Deep level transient spectroscopy study of the damage induced in n-type silicon by a gate oxide etching in a CHF3/Ar plasma

    Deep level transient spectroscopy study of the damage induced in n-type silicon by a gate oxide etching in a CHF3/Ar plasma por Adegboyega, G., Perez, I.V, Poggi, Antonella, Susi, E

    Publicado 2020
    Enlace del recurso
    Revista
    Agregar a favoritos
    Guardado en:
  2. 2
    The effects of oxygen precipitates on the electrical properties of silver impurities in p-type silicon

    The effects of oxygen precipitates on the electrical properties of silver impurities in p-type silicon por Adegboyega, G.A, Passari, L, Butturri, M.A, Susi, E

    Publicado 2023
    Enlace del recurso
    Revista
    Agregar a favoritos
    Guardado en:

Herramientas de búsqueda: