Torthaí cuardaigh - Susi, E
- 1 - 2 toradh as 2 á dtaispeáint
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1
Deep level transient spectroscopy study of the damage induced in n-type silicon by a gate oxide etching in a CHF3/Ar plasma de réir Adegboyega, G., Perez, I.V, Poggi, Antonella, Susi, E
Foilsithe / Cruthaithe 2020Faigh an téacs iomlán
IRIS -
2
The effects of oxygen precipitates on the electrical properties of silver impurities in p-type silicon de réir Adegboyega, G.A, Passari, L, Butturri, M.A, Susi, E
Foilsithe / Cruthaithe 2023Faigh an téacs iomlán
IRIS