Ohcanbohtosat - Susi, E

  • Čájehuvvo 1 - 2 / 2
Aiddostahte ozu
  1. 1
    Deep level transient spectroscopy study of the damage induced in n-type silicon by a gate oxide etching in a CHF3/Ar plasma

    Deep level transient spectroscopy study of the damage induced in n-type silicon by a gate oxide etching in a CHF3/Ar plasma Dahkki Adegboyega, G., Perez, I.V, Poggi, Antonella, Susi, E

    Almmustuhtton 2020
    Viečča ollesdeavstta
    Áigečála
    Lasit oiddohiidda
    Furkejuvvon:
  2. 2
    The effects of oxygen precipitates on the electrical properties of silver impurities in p-type silicon

    The effects of oxygen precipitates on the electrical properties of silver impurities in p-type silicon Dahkki Adegboyega, G.A, Passari, L, Butturri, M.A, Susi, E

    Almmustuhtton 2023
    Viečča ollesdeavstta
    Áigečála
    Lasit oiddohiidda
    Furkejuvvon:

Ohcanreaiddut: