Deep level transient spectroscopy study of the damage induced in n-type silicon by a gate oxide etching in a CHF3/Ar plasma
International Journal of vacuum science & technology B 15(3):623 - 628
Gorde:
| Egile Nagusiak: | Adegboyega, G., Perez, I.V, Poggi, Antonella, Susi, E |
|---|---|
| Formatua: | Aldizkaria |
| Hizkuntza: | ingelesa |
| Argitaratua: |
Journal of vacuum science & technology B
2020
|
| Gaiak: | |
| Sarrera elektronikoa: | https://ir.oauife.edu.ng/handle/123456789/5091 |
| Etiketak: |
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