Proton-induced X-ray emission (PIXE) analysis of trace elements of total atmospheric deposit (TAD) around a smelting industry:

Proton-induced X-ray emission (PIXE) analysis of trace elements of total atmospheric deposit (TAD) around a smelting industry:

An International Journal Of Taylor & Francis Group,P.16.

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Chigaekwu Godwin, EZEH, Paul Jerimiah, UGWO, Mayowa Festus, ADEBIYI, Emmanuel Olawale, ABIYE, Azuka Chinwe, ONWUDIEGWU, Ikechi Eusebius, OBIAJUNWA
Formatua: Aldizkaria
Hizkuntza:ingelesa
Argitaratua: Taylor & Francis Group 2023
Gaiak:
air pollution; PIXE; smelting industry; TAD; trace element
Sarrera elektronikoa:https://ir.oauife.edu.ng/123456789/5335
Etiketak: Etiketa erantsi
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Deskribapena
Gaia:An International Journal Of Taylor & Francis Group,P.16.

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